Optical characteristics of (La, Ce)B6 films deposited on silicon substrates by e-beam evaporation process

Thin Solid Films

Volumn 416, Issue 1-2, 2002, Pages 218-223

  Kafadaryan, E A ^a   Petrosyan, S I ^a   Badalyan, G R ^a   Harutyunyan, S R ^a   Kuzanyan, A S ^a  

^a Institute for Physical Research of NASA   (Armenia)

Author keywords

Borides; Conductivity; Optical spectroscopy

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRON BEAMS; EVAPORATION; LIGHT REFLECTION; PERMITTIVITY; POLYCRYSTALLINE MATERIALS; SILICON; SPECTRUM ANALYSIS; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

ELECTRON BEAM EVAPORATION;

THIN FILMS;

EID: 0037009753     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00716-2     Document Type: Article

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