Structure and properties of silver nanoparticles dispersed in SiO2 thin films obtained by in situ self-reduction

Materials Science and Engineering C

Volumn 19, Issue 1-2, 2002, Pages 295-298

  Compagnini, G ^a   D'Urso L ^a   Puglisi, O ^a  

^a Ist Naz de Fisica per la Materia   (Italy)

Author keywords

Self reduction; Silver nanoparticles; SiO2 thin films

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ORGANOMETALLICS; POLYMER BLENDS; SILICA; SILVER; SPIN COATING; THIN FILMS;

POST-DEPOSITION PARAMETERS;

NANOSTRUCTURED MATERIALS;

FILM; NANOPARTICLE; REDUCTION; SILICON DIOXIDE; SILVER;

EID: 0037006048     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(01)00402-7     Document Type: Article

References (12)