Neutron imaging with multi-wafer monochromators

Applied Physics A: Materials Science and Processing

Volumn 74, Issue SUPPL.I, 2002, Pages

  Popovici, M ^a   Stoica, A D ^b  

^a UNIVERSITY OF MISSOURI   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; IMAGING SYSTEMS; MONOCHROMATORS; NEUTRON SCATTERING; OPTICS; PHASE SPACE METHODS; REFLECTION; SILICON WAFERS;

MULTI-WAFER MONOCHROMATORS; NEUTRON IMAGING; NEUTRON WAVELENGTH; PHASE SPACE OPTICS; STRESS MAPPING MACHINES;

NEUTRON DETECTORS;

EID: 0037001756     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390201719     Document Type: Article

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