In situ SEM imaging at temperatures as high as 1450°C

Journal of Electron Microscopy

Volumn 51, Issue 6, 2002, Pages 347-352

  Gregori, Giuliano ^a   Kleebe, Hans Joachim ^b   Siegelin, Frank ^c   Ziegler, Günter ^a  

^a UNIVERSITY OF BAYREUTH   (Germany)

^b Department of Metallurgical and Materials Engineering   (United States)

^c INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

Heating stage; High temperature microstructure; In situ imaging; SEM

Indexed keywords

ARTICLE;

ASBESTOS; SCANNING ELECTRON MICROSCOPY; SERPENTINE;

HEATING STAGE; HIGH-TEMPERATURE IN SITU; HIGH-TEMPERATURE MICROSTRUCTURE; HIGHEST TEMPERATURE; IN SITU IMAGING; MICROSCOPE IMAGING; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRONS; SITU IMAGING; SITU SCANNING;

SINTERING;

EID: 0037001547     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/51.6.347     Document Type: Article

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