Direct comparison of SANS data with SEM image analysis

Applied Physics A: Materials Science and Processing

Volumn 74, Issue SUPPL.II, 2002, Pages

  Ryukhtin, V ^a,b   Saroun J ^a  

^a NUCLEAR PHYSICS INSTITUTE   (Czech Republic)

^b CHARLES UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CRYSTAL MICROSTRUCTURE; ERRORS; IMAGE ANALYSIS; NEUTRON SCATTERING; SCANNING ELECTRON MICROSCOPY;

INFINITE SLIT GEOMETRY; ISOTROPY; POROUS MICROSTRUCTURE; SMALL ANGLE NEUTRON SCATTERING; SYSTEMATICAL ERRORS;

POROUS MATERIALS;

EID: 0037001529     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390101166     Document Type: Article

References (6)

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3. J. Ŝaroun: J. Appl. Cryst. 33, 824 (2000)
4. L.A. Feigin, D.I. Svergun: Structure Analysis by Small-Angle X-ray and Neutron Scattering (Plenum, New York 1987)
5. A. Guinier, G. Fournet: Small Angle Scattering of X-rays (Wiley, New York 1955) p. 48
6. J. Schelten, W. Schmatz: J. Appl. Cryst. 13, 385 (1980)