D4c: A very high precision diffractometer for disordered materials

Applied Physics A: Materials Science and Processing

Volumn 74, Issue SUPPL.I, 2002, Pages

  Fischer, H E ^a   Cuello, G J ^b   Palleau, P ^b   Feltin, D ^b   Barnes, A C ^c   Badyal, Y S ^d   Simonson, J M ^d  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b INSTITUT LAUE LANGEVIN   (France)

^c UNIVERSITY OF BRISTOL   (United Kingdom)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INSTRUMENT TESTING; MEASUREMENT ERRORS; MICROSTRIP DEVICES; NEUTRON DETECTORS; NEUTRON DIFFRACTION; OPTICAL COLLIMATORS; RADIATION COUNTERS; RADIATION SHIELDING; STATISTICAL METHODS;

DETECTION STABILITY; DIFFRACTION MEASUREMENT; DISORDERED MATERIALS DIFFRACTOMETER; NEUTRON SHIELDING; TOTAL COUNTING RATE;

DIFFRACTOMETERS;

EID: 0037001267     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390101087     Document Type: Article

References (6)

1. A. Oed: Nucl. Instrum. Methods A 367, 34 (1995)
2. A. Oed: Nucl. Instrum. Methods A 263, 351 (1988)
3. H. Fischer: ILL Annual Report 1997, ILL, Grenoble, p. 85
4. H.E. Fischer, P. Palleau, D. Feltin: ILL Report No. ILL98FI15T, 17 November. ILL, Grenoble (1998)
5. H.E. Fischer, P. Palleau, D. Feltin: Physica B 276-278, 93 (2000)
6. H.E. Fischer, G.J. Cuello, P. Palleau, D. Feltin: ILL Annual Report 2000, ILL, Grenoble, p. 93