New evanescent neutron wave diffractometer at LLB

Applied Physics A: Materials Science and Processing

Volumn 74, Issue SUPPL.I, 2002, Pages

  Doan, T D ^a   Ott, F ^a   Menelle, A ^a   Humbert, P ^b   Fermon, C ^b   Prejbeanu, I L ^c   Rucker U ^d  

^a CEA SACLAY   (France)

^b SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

^c INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^d FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; GONIOMETERS; MAGNETIC THIN FILMS; NEUTRON DIFFRACTION; OPTICAL DESIGN; OPTICAL VARIABLES MEASUREMENT; PROBES; REFLECTOMETERS; REFRACTIVE INDEX;

BRAGG DIFFRACTION ANGLE; EVANESCENT NEUTRON WAVE DIFFRACTOMETER; GRAZING INCIDENCE DIFFRACTION; LAUE TYPE CONFIGURATION;

NEUTRON DIFFRACTION APPARATUS;

EID: 0036998790     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390101088     Document Type: Article

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