Radiation characterization and test methodology study of optocouplers devices for space applications

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn 1, Issue 2, 2002, Pages 166-171

  Mangeret, R ^a   Bonora, L ^b   Bouchet, T ^b   Peyre, D ^b   Harboe Sorensen, R ^c  

^a des Cosmonautes   (France)

^b AIRBUS DEFENCE AND SPACE   (Germany)

^c EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; NEUTRONS; PROTONS; RADIATION EFFECTS; RADIATION HARDENING;

INDUSTRIAL COST EFFECTIVE TEST; OPTOCOUPLERS; RADIATION CHARACTERIZATION;

OPTOELECTRONIC DEVICES;

EID: 0036995474     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. "Optoelectronic Devices with Complex Failure Modes", A. H. Johnston et al., IEEE NSREC Short Course, Reno July 2000.
2. "Proton Damage in Linear and Digital Optocouplers", A. H. Johnston et al., IEEE Trans. Nuc. Sc. Vol 47, no 3, June 2000.
3. "Proton Degradation of Light-Emitting Diodes", A. H. Johnston et al., IEEE Trans. Nuc. Sc. Vol 46, no 6, Dec. 1999.
4. "The Energy Dependence of Lifetime Damage Constants in GaAs LEDs for 1 to 500 MeV Protons", A. L. Barry et al., IEEE Trans. Nuc. Sc. Vol 42, no 6, Dec. 1995.
5. "A Compendium of Recent Optocoupler Radiation Test Data", K. A. Label et al., 2000 IEEE Rad. Effects Data Workshop Rec.
6. "Total Dose and Proton Damage in Optoisolators", B. G. Rax et al., IEEE Trans. Nuc. Sc. Vol 43, Dec. 1996.
7. "Energy dependence of Proton Damage in AlGaAs Light-Emitting Diodes", R. A. Reed et al., IEEE Trans. Nuc. Sc. Vol. 47, Dec. 2000.
8. "NIEL and Damage Correlations for High Energy Protons in Gallium Arsenide Devices", S.R. Messenger et al., presented at the 38th IEEE NSREC, July 2001.