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Volumn 1, Issue , 2002, Pages 227-230
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Nondestructive investigation of 4-inch langasite wafer acoustic homogeneity
b
Temex SAW
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC TRANSDUCERS;
ACOUSTIC WAVE VELOCITY MEASUREMENT;
CRYSTAL GROWTH;
ELECTRIC NETWORK ANALYZERS;
LEAST SQUARES APPROXIMATIONS;
NONDESTRUCTIVE EXAMINATION;
INTERDIGITAL TRANSDUCERS;
LANGASITE WAFER ACOUSTIC HOMOGENEITY;
ACOUSTIC SURFACE WAVE DEVICES;
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EID: 0036995311
PISSN: 10510117
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (5)
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