Layer of Protection Analysis: Lessons learned

Technical Papers of ISA: Safety Instrumented Systems for the Process Industry

Volumn , Issue , 2002, Pages 59-68

  Dowell III, Arthur M ^a  

^a ROHM AND HAAS COMPANY   (United States)

Author keywords

Alarm Systems; Documentation; Emergency Shutdown System; Fault Tree Analysis; Final Element; Instrumentation; Interlocks; Modeling; Probability of Failure on Demand; Qualitative; Quantitative; Safety; Sensors; Systems Design; Unavailability

Indexed keywords

FAULT TREE ANALYSIS; PROCESS ENGINEERING; RISK ASSESSMENT; SENSORS; SYSTEMS ANALYSIS;

EMERGENCY SHUTDOWN SYSTEMS;

ALARM SYSTEMS;

EID: 0036992828     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. Center for Chemical Process Safety (CCPS), Guidelines for Safe Automation of Chemical Processes, American Institute of Chemical Engineers, New York, NY, 1993.
2. The Instrumentation, Systems, and Automation Society (ISA), ANSI/ISA 84.01-1996, Application of Safety Instrumented Systems to the Process Industries, The Instrumentation, Systems, and Automation Society, Research Triangle Park, NC, 1996.
3. International Electrotechnical Commission, IEC 61508, Functional Safety of Electrical/Electronic/Programmable Electronic Safety-related Systems, Parts 1-7, Geneva: International Electrotechnical Commission, 1998.
4. Dowell, A. M., III, "Layer of Protection Analysis for Determining Safety Integrity Level," ISA Transactions 37 155-165.
5. Dowell, A. M., III, "Layer of Protection Analysis: A New PHA Tool, After HAZOP, Before Fault Tree Analysis," Presented at Center for Chemical Process Safety International Conference and Workshop on Risk Analysis in Process Safety, Atlanta, GA, October 21, 1997, American Institute of Chemical Engineers, New York, NY, 1997.
6. Center for Chemical Process Safety (CCPS), Layer of Protection Analysis, Simplified Process Risk Assessment, American Institute of Chemical Engineers, New York, NY, 2001.
7. Dowell, A. M., III "Layer of Protection Analysis - A Worked Distillation Example" ISA Tech/1999, Philadelphia PA, The Instrumentation, Systems, and Automation Society, Research Triangle Park, NC, 1999.
8. Center for Chemical Process Safety (CCPS), Inherently Safer Chemical Processes: A Life Cycle Approach, American Institute of Chemical Engineers, New York, NY, 1996.
9. Dowell, A. M., III "Layer of Protection Analysis and Inherently Safer Processes," Process Safety Progress, 18, 4, 214-220.
10. International Electrotechnical Commission, IEC 61511, Functional Safety Instrumented Systems for the Process Industry Sector, Parts 1-3, International Electrotechnical Commission, Geneva, Draft in Progress.