The characterization of SAW coupling factor from paired IDT insertion loss measurements

Proceedings of the IEEE Ultrasonics Symposium

Volumn 1, Issue , 2002, Pages 231-234

  Hickernell, Fred S ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; ALUMINUM NITRIDE; COUPLINGS; DEPOSITION; ELECTRIC NETWORK ANALYZERS; INSERTION LOSSES; PIEZOELECTRIC MATERIALS;

HARMONIC RICH SPLIT FINGER; INTERDIGITAL TRANSDUCERS;

ACOUSTIC TRANSDUCERS;

EID: 0036992334     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. F. S. Hickernell, "Thin-Films for SAW Devices," International Journal of High Speed Electronics and Systems, vol. 10, pp.603-652, 2000.
2. Takashi Aoki and Shuzo Hattori, "Equivalent circuit parameters for harmonic operation of SAW transducers," Proceedings IEEE 1977 Ultrasonics Symposium, pp. 653-658, October
3. F. J. Hickernell, R. X. Yue, and F. S. Hickernell "Statistical Modeling for the Optimal Deposition Conditions of Sputtered Piezoelectric Films," IEEE Trans. Ultrasonics, Ferroelectrics and Frequency Control, vol. 44, pp. 615-623, 1997
4. J. H. Harris, R. A. Youngman, and R. G. Teller, "On the nature of the oxygen-related defect in aluminum nitride," Journal of Material Research, vol. 5, pp. 1763-1773, 1990.