Single-event transient (SET) characterization of a LM119 voltage comparator: An approach to SET model validation using a pulsed laser

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn 1, Issue 2, 2002, Pages 431-437

  Buchner, S ^a,b   McMorrow, D ^a   Sternberg, A ^c   Massengill, L ^c   Pease, R L ^d   Maher, M ^e  

^a NAVAL RESEARCH LABORATORY   (United States)

^b SFA INC   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d RLP Research   (United States)

^e NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; COMPUTER SIMULATION; MATHEMATICAL MODELS; PULSED LASER APPLICATIONS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING; TRANSIENTS; TRANSISTORS;

CIRCUIT SIMULATOR PROGRAMS; SINGLE EVENT TRANSIENT;

COMPARATOR CIRCUITS;

EID: 0036989675     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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