On the characterization of large format LC devices for adaptive and active optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4825, Issue , 2002, Pages 41-45

  Restaino, Sergio R ^a   Martinez, Ty ^b   Andrews, Jonathan R ^c   Teare, Scott W ^b,c  

^a NAVAL RESEARCH LABORATORY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c NEW MEXICO INSTITUTE OF MINING AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE OPTICS; BANDWIDTH; IMAGE QUALITY; MIRRORS; OPTICAL VARIABLES MEASUREMENT; PHASE CONTROL; WAVEFRONTS;

ACTIVE OPTICS; DEFORMABLE MIRROR; HIGH RESOLUTION WAVEFRONT CONTROL; OPTICAL QUALITY;

LIQUID CRYSTAL DISPLAYS;

EID: 0036989590     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.457853     Document Type: Conference Paper

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