A survey of multivariate calibration methods for pattern classification

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4902, Issue , 2002, Pages 521-527

  Plach, Hartwig ^a   Eitzinger, C ^b   Berndorfer, Thomas ^a   Van Dyck, Walter ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b PROFACTOR GMBH   (Austria)

Author keywords

Linear discrimination and pattern classification; Multivariate calibration

Indexed keywords

ALGORITHMS; CALIBRATION; COMPUTATIONAL COMPLEXITY; IMAGE PROCESSING; OPTIMIZATION; PRINCIPAL COMPONENT ANALYSIS; REGRESSION ANALYSIS;

LINEAR DISCRIMINATION; MULTIVARIATE CALIBRATION; PARTIAL LEAST SQUARES REGRESSION; PRINCIPAL COMPONENT REGRESSION;

PATTERN RECOGNITION;

EID: 0036987009     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.467254     Document Type: Conference Paper

References (8)

1. R. O. Duda, P. E. Hart, D. G. Stork. Pattern Classification, John Wiley & Sons, New York, 2000.
2. H. Martens, T. Naes, Multivariate Calibration, Wiley & Sons, 1998.
3. Richard O. Duda, Peter E. Hart, David G. Stork, Pattern Classification and Scene Analysis, Wiley Interscience, 2000.
4. R. A. Fisher, The Use of Multiple Measurements in Taxonomic Problems, Annals of Eugenics, vol. 7, part II, pp. 179-188, 1936.
5. Geoffrey J. McLachlan, Discriminant Analysis and Statistical Pattern Recognition, Wiley, New York, 1992.
6. C. Eitzinger, H. Plach, "A New Approach to Perception Training", submitted paper to IEEE, February 2002. For further information please contact Christian Eitzinger, Profactor Research, Wehrgrabengasse 5, A-4400 Steyr, Austria, e-mail: christian.eitzinger@profactor.at.
7. Tristrom Cooke, "Two Variations on Fisher's Linear Discriminant for Pattern Recognition", IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol.24, No. 2, February 2002.
8. T. Berndorfer, C. Eitzinger, A. Brenner and W. Van Dyck, "A Multivariate Approach to obtain Real Time Behaviour of Image Processing Applications", Process Imaging for Automatic Control, Proceedings of SPIE, Boston, 5.-6. November 2000.