Two-dimensional optical measurement techniques based on optical birefringence effects

Optical Engineering

Volumn 41, Issue 12, 2002, Pages 3183-3192

  Zhu, Yongchang ^a   Takada, Tatsuo ^b   Murooka, Yoshihiro ^b  

^a Sankosha Corp   (Japan)

^b TOKYO CITY UNIVERSITY   (Japan)

Author keywords

Electro optic Kerr effect; Electro optic Pockels effect; On line defect diagnosis; Photoelastic effect; System and intrinsic functions; System nonuniformity; System reliability; Two dimensional lock in processing

Indexed keywords

BIREFRINGENCE; IMAGE SENSORS; KERR ELECTROOPTICAL EFFECT; PHOTODETECTORS; PHOTOELASTICITY; SIGNAL TO NOISE RATIO; VECTOR QUANTIZATION;

OPTICAL BIREFRINGENCE EFFECTS;

IMAGE PROCESSING;

EID: 0036986357     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1510535     Document Type: Article

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