Ultrafast studies of photoexcited electronic dynamics in thiol-capped CdTe semiconductor nanoparticles

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4807, Issue , 2002, Pages 189-196

  Wu, Fanxin ^a   Zhang, Jin Z ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Auger recombination; CdTe; Dynamics; Exciton excito n annihilation; Nanoparticles; Photoionization; Semiconductor

Indexed keywords

ABSORPTION SPECTROSCOPY; ALCOHOLS; ELECTRON EMISSION; ELECTRON TRAPS; ELECTRONIC DENSITY OF STATES; ELECTRONIC PROPERTIES; MOLECULAR DYNAMICS; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; PHOTOIONIZATION; TRANSMISSION ELECTRON MICROSCOPY; ULTRAFAST PHENOMENA;

CHARGE CARRIER DYNAMICS; ELECTRONIC RELAXATION DYNAMICS; FEMTOSECOND LASER SPECTROSCOPY; PHOTOEXCITED ELECTRONIC DYNAMICS; SEMICONDUCTOR NANOPARTICLES; STATIC ELECTRONIC MICROSCOPY; STEADY STATE EMISSION MEASUREMENTS;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0036983650     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451004     Document Type: Conference Paper

References (17)

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