A dynamic element matching approach to ADC testing

Midwest Symposium on Circuits and Systems

Volumn 2, Issue , 2002, Pages

  Olleta, Beatriz ^a   Chen, Degang ^a   Geiger, Randall ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL TO ANALOG CONVERSION; ELECTRONIC EQUIPMENT TESTING; ERROR CORRECTION;

DEVICE UNDER TEST (DUT);

ANALOG TO DIGITAL CONVERSION;

EID: 0036979623     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. Jensen H. T. and Galton I., "A Low-Complexity Dynamic Element Matching DAC for Direct Digital Synthesis." IEEE Transactions on Circuits and Systems, Vol. 45, pp. 13-27, January 1998.
2. Jensen H. T. and Galton I., "A Performance Analysis of the Partial Randomization Dynamic Element Matching DAC Architecture".1997 IEEE International Symposium on Circuits and Systems, pp. 9-12, Hong Kong, 1997.
3. Gallon I. and Carbone P. "A Rigorous Error Analysis of D/A Conversion with Dynamic Element Matching". IEEE Transactions on Circuits and Systems, Vol. 42, pp. 763-772, December 1995.