Thickness-dependent phase transformations in implanted iron

Hyperfine Interactions

Volumn 139-140, Issue 1-4, 2002, Pages 369-377

  Kopcewicz, M ^a   Jagielski, J ^b   Matz, W ^c  

^a Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

^b SOLTAN INSTITUTE FOR NUCLEAR STUDIES   (Poland)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IRON; NITROGEN;

ANALYTIC METHOD; CONFERENCE PAPER; FILM; MOSSBAUER SPECTROSCOPY; PHASE TRANSITION; THICKNESS; X RAY DIFFRACTION;

EID: 0036977637     PISSN: 03043843     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1021235708455     Document Type: Conference Paper

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