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Volumn 66, Issue 21, 2002, Pages 2121011-2121014

Localized mechanical instabilities in electronic structure calculations of silica glass under pressure

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; SILICON DERIVATIVE; SILICON DIOXIDE;

EID: 0036972536     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (15)

References (23)
  • 13
    • 24444468650 scopus 로고
    • M. J. S. Dewer and W. Thiel, J. Am. Chem. Soc. 99, 4899 (1977); M. J. S. Dewer, J. Friedheim, G. Grady, E. F. Healy and J. J. P. Stewart, Organometallics 5, 375 (1986).
    • (1977) J. Am. Chem. Soc. , vol.99 , pp. 4899
    • Dewer, M.J.S.1    Thiel, W.2
  • 15
    • 33646612633 scopus 로고    scopus 로고
    • Schrodinger, Inc., New York
    • Computer code MOPAC 2000, (Schrodinger, Inc., New York, 1999).
    • (1999) Computer Code MOPAC 2000


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.