Atomic force microscopy, X-ray diffraction, X-ray photoelectron spectroscopy and thermal studies of the new melamine fiber

Journal of Adhesion Science and Technology

Volumn 16, Issue 14, 2002, Pages 1957-1978

  Rajeev, R S ^a   De, S K ^a   Bhowmick, Anil K ^a   Gong, Bill ^b   Bandyopadhyay, S ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Ageing; Atomic force microscopy; Crystallinity; Melamine fiber; Morphology; Thermal stability; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MORPHOLOGY; THERMOANALYSIS; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; MELAMINE FORMALDEHYDE RESINS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; SYNTHETIC FIBERS; THERMODYNAMIC STABILITY;

MELAMINE FILTERS;

MELAMINE; SPINNING (FIBERS);

AFM; AGEING; ATOMIC FORCE; CARBONYL GROUPS; CHARACTERIZATION TECHNIQUES; CRYSTALLINITIES; DIE LINE; FIBER SURFACE; HIGH CONCENTRATION; HIGH THERMAL STABILITY; HYDROXYL GROUPS; MELAMINE FIBER; MELAMINE FIBERS; MORPHOLOGICAL STUDY; OXIDATIVE ENVIRONMENT; POLYMERIC MATRICES; PREPOLYMERS; ROUGHNESS ANALYSIS; SURFACE HYDROXYL GROUPS; SURFACE OXIDATIONS; THERMAL STUDY;

EID: 0036960761     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/15685610260427719     Document Type: Article

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