-
1
-
-
0012699768
-
-
Bruker; Bruker AXS Inc., Madison, Wisconsin, USA
-
Bruker (1997-2000), SMART. Version 5.618. Bruker AXS Inc., Madison, Wisconsin, USA.
-
(1997)
SMART. Version 5.618
-
-
-
2
-
-
0037142065
-
-
Davis M. E. (2002). Nature, 417, 813-821.
-
(2002)
Nature
, vol.417
, pp. 813-821
-
-
Davis, M.E.1
-
5
-
-
0004059581
-
-
translated by J. E. Lohr; Berlin, Heidelberg, New York: Springer-Verlag
-
Kortum, G. (1969). Reflectance Spectroscopy: Principles, Methods and Applications, translated by J. E. Lohr, pp. 170-216. Berlin, Heidelberg, New York: Springer-Verlag.
-
(1969)
Reflectance Spectroscopy: Principles, Methods and Applications
, pp. 170-216
-
-
Kortum, G.1
-
6
-
-
0001762761
-
-
McCarthy, T.J., Ngeyi, S.P., Liao, J.H., DeGroot, D.C., Hogan, T., Kannewurf, C. R. & Kanatzidis, M. G. (1993). Chem. Mater. 5, 331-338.
-
(1993)
Chem. Mater.
, vol.5
, pp. 331-338
-
-
McCarthy, T.J.1
Ngeyi, S.P.2
Liao, J.H.3
Degroot, D.C.4
Hogan, T.5
Kannewurf, C.R.6
Kanatzidis, M.G.7
-
7
-
-
0001278397
-
-
Menon, S., Rajasekharan, M. V. & Tuchagues, J. P. (1997). Inorg. Chem. 36, 4341-4346.
-
(1997)
Inorg. Chem.
, vol.36
, pp. 4341-4346
-
-
Menon, S.1
Rajasekharan, M.V.2
Tuchagues, J.P.3
-
9
-
-
0031501893
-
-
Ravikumar, K., Swamy, G. Y. S. K., Lakshmi, N. V. & Chandramohan, K. (1997). J. Chem. Crystallogr. 27, 119-124.
-
(1997)
J. Chem. Crystallogr.
, vol.27
, pp. 119-124
-
-
Ravikumar, K.1
Swamy, G.Y.S.K.2
Lakshmi, N.V.3
Chandramohan, K.4
-
10
-
-
0000919199
-
-
Ravikumar, K., Swamy, G. Y. S. K. & Venkata Lakshmi, N. (1995) Acta Cryst. 51, 608-609.
-
(1995)
Acta Cryst.
, vol.51
, pp. 608-609
-
-
Ravikumar, K.1
Swamy, G.Y.S.K.2
Venkata Lakshmi, N.3
-
11
-
-
0004283942
-
-
University of Göttingen, Germany
-
Sheldrick, G. M. (1996). SADABS. University of Göttingen, Germany.
-
(1996)
SADABS
-
-
Sheldrick, G.M.1
-
13
-
-
0003604835
-
-
Siemens; Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens (1990) XP. Version 4.2 for MS-DOS. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1990)
XP. Version 4.2 for MS-DOS
-
-
-
14
-
-
0004009842
-
-
Siemens; Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens (1995), SAINT. Version 4.05. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1995)
SAINT. Version 4.05
-
-
-
15
-
-
0000849979
-
-
Swamy, G. Y. S. K., Chandramohan, K., Lakshmi, N. V. & Ravikumar, K. (1998). Z. Kristallogr. 213, 191-104.
-
(1998)
Z. Kristallogr.
, vol.213
, pp. 191-194
-
-
Swamy, G.Y.S.K.1
Chandramohan, K.2
Lakshmi, N.V.3
Ravikumar, K.4
-
16
-
-
0012739274
-
-
Tong, M.-L., Yang, G. & Chen, X.-M. (2000). Aust. J. Chem. 53, 607-610.
-
(2000)
Aust. J. Chem.
, vol.53
, pp. 607-610
-
-
Tong, M.-L.1
Yang, G.2
Chen, X.-M.3
-
18
-
-
0002321864
-
-
Yoo, J., Kim, J.-M., John, Y. S. & Do, Y. (1997) Inorg. Chim. Acta, 263, 53-60.
-
(1997)
Inorg. Chim. Acta
, vol.263
, pp. 53-60
-
-
Yoo, J.1
Kim, J.-M.2
John, Y.S.3
Do, Y.4
-
19
-
-
0009854924
-
-
Zhuang, J.-Z., You, X.-Z. & Yang, Q.-C. (1994). Polyhedron, 13, 1951-1955.
-
(1994)
Polyhedron
, vol.13
, pp. 1951-1955
-
-
Zhuang, J.-Z.1
You, X.-Z.2
Yang, Q.-C.3
|