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Volumn 17, Issue 4, 2002, Pages 270-277

Influence of planar defects on powder diffractograms of fcc metals

Author keywords

Fcc crystal; Planar defects; X ray powder diffraction

Indexed keywords

PLANAR DEFECTS;

EID: 0036958896     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1523080     Document Type: Article
Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.