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Volumn 12, Issue 4, 2002, Pages 197-218

Can fault-exposure-potential estimates improve the fault detection abilities of test suites?

Author keywords

Code coverage; Fault exposure potential; Software testing; Test adequacy criteria

Indexed keywords

C (PROGRAMMING LANGUAGE); COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; DATA FLOW ANALYSIS; ERROR DETECTION; FAILURE ANALYSIS; PROBABILITY; PROGRAM DEBUGGING; PROGRAM DIAGNOSTICS; PROGRAM INTERPRETERS;

EID: 0036957687     PISSN: 09600833     EISSN: None     Source Type: Journal    
DOI: 10.1002/stvr.257     Document Type: Article
Times cited : (12)

References (19)
  • 4
    • 0027845997 scopus 로고
    • Dynamic impact analysis: A cost-effective technique to enforce error-propagation
    • Cambridge, MA, ACM Press: New Yorkk
    • Goradia T. Dynamic impact analysis: A cost-effective technique to enforce error-propagation. Proceedings of the ACM International Symposium on Software Testing and Analysis, Cambridge, MA, ACM Press: New Yorkk, 1993; 171-181.
    • (1993) Proceedings of the ACM International Symposium on Software Testing and Analysis , pp. 171-181
    • Goradia, T.1
  • 7
    • 0027617421 scopus 로고
    • An analysis of test data selection criteria using the relay model of fault detection
    • Richardson DJ, Thompson MC. An analysis of test data selection criteria using the relay model of fault detection. IEEE Transactions on Software Engineering 1993; 19(6):533-553.
    • (1993) IEEE Transactions on Software Engineering , vol.19 , Issue.6 , pp. 533-553
    • Richardson, D.J.1    Thompson, M.C.2
  • 9
  • 13
    • 0020152782 scopus 로고
    • Weak mutation testing and completeness of test sets
    • Howden WE. Weak mutation testing and completeness of test sets. IEEE Transactions on Software Engineering 1982; 8(4):371-379.
    • (1982) IEEE Transactions on Software Engineering , vol.8 , Issue.4 , pp. 371-379
    • Howden, W.E.1
  • 14
    • 0017959155 scopus 로고
    • Hints on test data selection: Help for the practicing programmer
    • DeMillo RA, Lipton RJ, Sayward FG. Hints on test data selection: Help for the practicing programmer. IEEE Computer 1978; 11(4):34-41.
    • (1978) IEEE Computer , vol.11 , Issue.4 , pp. 34-41
    • Demillo, R.A.1    Lipton, R.J.2    Sayward, F.G.3
  • 16
    • 0024033855 scopus 로고
    • The category-partition method for specifying and generating functional tests
    • Ostrand TJ, Balcer MJ. The category-partition method for specifying and generating functional tests. Communications of the ACM 1988; 31(6):676-686.
    • (1988) Communications of the ACM , vol.31 , Issue.6 , pp. 676-686
    • Ostrand, T.J.1    Balcer, M.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.