Orientation correction method of distorted samples during in situ deformations using a high resolution EBSD

Materials Science Forum

Volumn 408-412, Issue I, 2002, Pages 203-208

  Han, Jun Hyun ^a,b   Baeck, Suk Min ^b   Oh, Kyu Hwan ^b   Chung, Young Hoon ^a  

^a Korea Institute of Science and Technology   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

EBSD; In Situ Deformation; Orientation Correction

Indexed keywords

CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; SHEAR DEFORMATION; X RAY DIFFRACTION ANALYSIS;

ELECTRON BACKSCATTERED DIFFRACTION (EBSD);

CRYSTAL ORIENTATION;

EID: 0036956719     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.408-412.203     Document Type: Conference Paper

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