Texture evolution in grain growth of nanocrystalline Ni

Materials Science Forum

Volumn 408-412, Issue I, 2002, Pages 937-942

  Kim, Bae Kyun ^a   Szpunar, Jerzy A ^a   Varano, Rocco ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

Annealing; Fiber Texture; Grain Growth; Nanocrystalline NJ; Orientation Imaging Microscopy OIM

Indexed keywords

ANNEALING; CRYSTAL MICROSTRUCTURE; ELECTRODEPOSITION; FIBERS; GRAIN BOUNDARIES; GRAIN GROWTH; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; TEXTURES; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS;

ORIENTATION IMAGING MICROSCOPY (OIM);

NICKEL;

EID: 0036956026     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.408-412.937     Document Type: Conference Paper

References (15)

1. U. Erb: Nanostructured Mater. V. 6 (1995), p. 533-538.
2. H. Wolf, Z. Guan, H. Natter, R. Hempelmann and Th. Wichert: Mater. Sci. Forum V. 360-362 (2001), p. 247-252.
3. M.C. Iordache, S.H. Whang, Z. Jiao and Z.M Wang: Nanostructured Mater. V. 11 (1999), p. 1343-1349.
4. G.D. Hibbard, U. Erb, K.T. Aust and G. Palumbo: Mat. Res. Soc. Symp. Proc. V. 580 (1999), p. 183-188.
5. N. Wang, Z. Wang, K.T. Aust and U. Erb: Acta Mater. V. 45 (1997) p. 1655-1669.
6. U. Klement, U. Erb, A.M. El-Sherik and K.T. Aust: Mat. Sci. Eng. A203 (1995), p. 177-186.
7. A. El-Sherik, PhD Thesis: Synthesis, Structure and Properties of Electrodeposited Bulk Nonocrystalline Nickel (Queen's Univ., Kingston, Canada, 1994).
8. F. Czerwinski, H. Li, M. Megret, J.A. Szpunar, D.G. Clark and U. Erb: Scripta Mater. V. 37 (1997), p. 1967-1972.
9. st Joint Int. Conf. On Recrystallization and Grain Growth, ed. G. Gottstein and D.A. Molodov, 2002, Springer, p. 525-530.
10. K. Pawlik, J. Pospiech and K. Lücke: Texture and Microstructure V. 14-18 (1991), p. 25-30.
11. L. Houlong: TexTool, ver.3.1 (2001).
12. A. Morawiec, J.A. Szpunar and D.C. Hinz: Acta Metall. Mater. V. 41 (1993), p. 2825-2832.
13. V. Randle: The Role of the Coincidence Site Lattice in Grain Boundary Engineering (The Institute of Materials, UK 1996).
14. V. Randle: Mat. Sci. Tech. V. 7 (1991), p. 985-990.
15. S. Mader, R. Feder and P. Chaudhari: Thin Solid Films V. 14 (1972), p. 63-78.