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Volumn , Issue , 2002, Pages 134-137

Progress in screen printed front side metallization schemes for CSiTF solar cells

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTALLINE MATERIALS; ELECTRIC INSULATION; METALLIZING; SCREEN PRINTING; SILICON WAFERS; SILVER COMPOUNDS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS;

EID: 0036953636     PISSN: 01608371     EISSN: None     Source Type: Journal    
DOI: 10.1109/PVSC.2002.1190474     Document Type: Article
Times cited : (3)

References (9)
  • 1
    • 0002987960 scopus 로고    scopus 로고
    • High efficiency (19.2%) silicon thin-film solar cells with interdigitated emitter and base front-contacts
    • C. Hebling, et al., “High Efficiency (19.2%) Silicon Thin-Film Solar Cells with Interdigitated Emitter and Base Front-Contacts”, Proc. 14th EU PVSEC, 1997, pp. 2318.
    • Proc. 14th EU PVSEC, 1997 , pp. 2318
    • Hebling, C.1
  • 2
    • 0031388369 scopus 로고    scopus 로고
    • Dry processing of mc-silicon thin-film solar cells on foreign substrates leading to 11 % efficiency
    • R. Lüdemann, S. Schaefer, and C. Schüle, “Dry Processing of mc-Silicon Thin-Film Solar Cells on Foreign Substrates leading to 11 % Efficiency”, Proc. 26th IEEE PVSC, 1997, pp. 159.
    • Proc. 26th IEEE PVSC, 1997 , pp. 159
    • Lüdemann, R.1    Schaefer, S.2    Schüle, C.3
  • 3
    • 0012608958 scopus 로고    scopus 로고
    • Printed interdigitated front side metallisation for c-Si thin film solar cell - Three industrially applicable concepts
    • D.M. Huljic, et al., “Printed Interdigitated Front Side Metallisation For c-Si Thin Film Solar Cell - Three Industrially Applicable Concepts”, Proc. 16th EU PVSEC, 2000, pp. 1471-1475.
    • Proc. 16th EU PVSEC, 2000 , pp. 1471-1475
    • Huljic, D.M.1
  • 4
    • 0012568959 scopus 로고    scopus 로고
    • Behaviour of PECVD silicon nitride antireflection and passivation layers in rapid thermal firing through processes
    • to be published
    • D.M. Huljic, et al., “Behaviour of PECVD Silicon Nitride Antireflection and Passivation Layers in Rapid Thermal Firing Through Processes”, Proc. 17th EU PVSEC, 2001, to be published.
    • Proc. 17th EU PVSEC, 2001
    • Huljic, D.M.1
  • 5
    • 84949545794 scopus 로고    scopus 로고
    • Rapid thermal firing of screen printed contacts for large area crystalline silicon solar cells
    • D.M. Huljic, et al., “Rapid Thermal Firing of Screen Printed Contacts for Large Area Crystalline Silicon Solar Cells”, Proc. 28th IEEE PVSC, 2000, pp. 379-382.
    • Proc. 28th IEEE PVSC, 2000 , pp. 379-382
    • Huljic, D.M.1
  • 6
    • 0012567591 scopus 로고    scopus 로고
    • High quality screen-printed and fired-through silicon nitride rear contacts for bifacial silicon solar cells
    • B. Lenkeit, et al., “High Quality Screen-Printed and Fired-Through Silicon Nitride Rear Contacts for Bifacial Silicon Solar Cells”, Proc. 16th EU PVSEC, 2000, pp. 1332-1335.
    • Proc. 16th EU PVSEC, 2000 , pp. 1332-1335
    • Lenkeit, B.1
  • 7
    • 0003378967 scopus 로고    scopus 로고
    • Effective passivation of the low resistivity silicon surface by a rapid thermal oxide/PECVD silicon nitride stack and application to passivated rear and bifacial Si solar cells
    • A. Rohatgi, S. Narasimha, and D.S. Ruby, “Effective Passivation of the low Resistivity Silicon Surface by a Rapid Thermal Oxide/PECVD Silicon Nitride Stack and Application to Passivated Rear and Bifacial Si Solar Cells”, Proc. 2nd WCPEC, 1998, pp. 1566-1569.
    • Proc. 2nd WCPEC, 1998 , pp. 1566-1569
    • Rohatgi, A.1    Narasimha, S.2    Ruby, D.S.3
  • 8
    • 0005497355 scopus 로고    scopus 로고
    • Investigation of the effect of p/n-junctions bordering on the surface of silicon solar cells
    • R. Kühn, et al., “Investigation of the effect of p/n-junctions bordering on the surface of silicon solar cells”, Proc. 2nd WCPEC, 1998, pp. 1390-1393.
    • Proc. 2nd WCPEC, 1998 , pp. 1390-1393
    • Kühn, R.1
  • 9
    • 85013618296 scopus 로고    scopus 로고
    • Shunt-analysis of epitaxial silicon thin-film solar cells by lock-in thermography
    • this conference
    • S. Bau, et al., “Shunt-analysis of epitaxial silicon thin-film solar cells by lock-in thermography”, this conference, 2002.
    • (2002)
    • Bau, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.