Monitoring current-voltage characteristics of photovoltaic modules

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 1516-1519

  Van Dyk, E E ^a   Gxasheka, A R ^a   Meyer, E L ^a  

^a NELSON MANDELA METROPOLITAN UNIVERSITY   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC LOADS; FAILURE ANALYSIS; HALL EFFECT TRANSDUCERS; RADIATION EFFECTS; RESISTORS; SOLAR CELL ARRAYS; SYSTEMS ANALYSIS; TEMPERATURE;

IRRADIANCE EFFECTS; MODULE TEMPERATURES; PHOTOVOLTAIC MODULES; SEQUENCER SYSTEMS; VOLTAGE TRANSDUCERS;

SOLAR CELLS;

EID: 0036953465     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. E.E. van Dyk and E.L. Meyer (2001), "Long-term Monitoring of Photovoltaic Modules in South Africa", Proceedings of the 28th IEEE PV specialist conference, Anchorage, Alaska, pg 1525-1528.
2. E.L. Meyer and E.E. van Dyk (2001) Assessing the Performance Parameter of PV modules", Submitted for publication in the IEEE Trans. on Rel.
3. E. Lorenzo (1994) Solar Electricity Engineering of Photovoltaic systems, pg 81-85.
4. E.E. van Dyk, B.J. Scott, E.L. Meyer and A.W.R. Leitch (2000), "Temperature dependence of performance of crystalline silicon photovoltaic modules", South African Journal of Science 96, pg 198-200.
5. 0 and n from Isc and Voc measurements", Submitted for publication in journal of Applied Physics.