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Volumn , Issue , 2002, Pages 1086-1089

Thermionic emission model for interface effects on the open-circuit voltage of amorphous silicon based solar cells

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELECTRONS; SEMICONDUCTING SILICON; THERMIONIC EMISSION;

EID: 0036953397     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (14)

References (18)
  • 1
    • 6244268885 scopus 로고
    • edited by H. S. Ullal and C. Edwin Witt (AIP Conf. Proc. Vol. 353, Woodbury)
    • R. S. Crandall and E. A. Schiff, in 13th NREL Photovoltaics Program Review, edited by H. S. Ullal and C. Edwin Witt (AIP Conf. Proc. Vol. 353, Woodbury, 1995), p. 101.
    • (1995) 13th NREL Photovoltaics Program Review , pp. 101
    • Crandall, R.S.1    Schiff, E.A.2
  • 2
    • 84897676491 scopus 로고
    • edited by E. A. Schiff, et al. (Materials Research Society Symposium Proceedings
    • J. Yang, X. Xu, and S. Guha, in Amorphous Silicon Technology-1994, edited by E. A. Schiff, et al. (Materials Research Society Symposium Proceedings Vol. 336, 1994), p. 687.
    • (1994) Amorphous Silicon Technology-1994 , vol.336 , pp. 687
    • Yang, J.1    Xu, X.2    Guha, S.3
  • 12
    • 0012572797 scopus 로고    scopus 로고
    • note
    • OC for for cells with poor and optimal p-layers declines at lower intensities.
  • 13
    • 0012576671 scopus 로고    scopus 로고
    • note
    • AMPS PC is a copyright of Pennsylvania State University, and was developed by Stephen Fonash's research group there.
  • 15
    • 0012613988 scopus 로고    scopus 로고
    • note
    • C.
  • 16
    • 0012570848 scopus 로고    scopus 로고
    • note
    • Fh across the p/i interface. Unlike the thermionic emisson case, no analytical approximation to this relation has been proposed. Such an approximation would be quite enlightening.
  • 17
    • 0012606784 scopus 로고    scopus 로고
    • note
    • This assumption that only the conduction bandedge is involved in alloying with Ge is suggested by bandtail widths. The conduction bandtail width broadens markedly with alloying, while the valence bandtail width does not. The issue certainly needs further study.
  • 18
    • 0012570850 scopus 로고    scopus 로고
    • edited by J. R. Abelson, et al. (Materials Research Society Symposium Proceedings Vol. 715, Pittsburgh), in press.
    • Y. Liu and V. L. Dalal, in Amorphous and Heterogeneous Silicon-Based Films-2002, edited by J. R. Abelson, et al. (Materials Research Society Symposium Proceedings Vol. 715, Pittsburgh, 2002), in press.
    • (2002) Amorphous and Heterogeneous Silicon-Based Films-2002
    • Liu, Y.1    Dalal, V.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.