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Volumn , Issue , 2002, Pages 243-246

Comparison of dielectric surface passivation of monocrystalline and multicrystalline silicon

Author keywords

[No Author keywords available]

Indexed keywords

NUMERICAL METHODS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REDUCTION; SCREEN PRINTING; SILICON WAFERS; SURFACE TREATMENT; VELOCITY;

EID: 0036953320     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (12)
  • 3
    • 0012569934 scopus 로고    scopus 로고
    • Al BSF for thin screenprinted multicrystalline Si solar cells
    • A. Schneider et al., "Al BSF for thin screenprinted multicrystalline Si solar cells," Seventeenth EU-PVSEC, 2001.
    • Seventeenth EU-PVSEC, 2001
    • Schneider, A.1
  • 4
  • 5
    • 0000108791 scopus 로고    scopus 로고
    • Recond low surface recombination velocities on 1 Ω-cm p-silicon using remote plasma silicon nitride passivation
    • T. Lauinger, J. Schmidt, A. Aberle, and R. Hezel, "Recond low surface recombination velocities on 1 Ω-cm p-silicon using remote plasma silicon nitride passivation," Appl. Phys. Lett. 68, 1996, pp. 1232-1234.
    • (1996) Appl. Phys. Lett. , vol.68 , pp. 1232-1234
    • Lauinger, T.1    Schmidt, J.2    Aberle, A.3    Hezel, R.4
  • 6
    • 0030415291 scopus 로고    scopus 로고
    • Dependence of cell performance on wafer thickness for BSF and non-BSF cells
    • T. Koval, J. Wohlegemuth, and B. Kinsey, "Dependence of cell performance on wafer thickness for BSF and non-BSF cells," Twenty-fifth IEEE PVSC, 1996, pp. 505-507.
    • (1996) Twenty-Fifth IEEE PVSC , pp. 505-507
    • Koval, T.1    Wohlegemuth, J.2    Kinsey, B.3
  • 7
    • 0033878462 scopus 로고    scopus 로고
    • Electropassivation of silicon and bulk lifetime determination with dry polymer contact
    • H. Schulenburg and H. Tributsch, "Electropassivation of silicon and bulk lifetime determination with dry polymer contact," J. Phys. D. 33, 2000, pp. 851-858.
    • (2000) J. Phys. D. , vol.33 , pp. 851-858
    • Schulenburg, H.1    Tributsch, H.2
  • 8
    • 0036604597 scopus 로고    scopus 로고
    • Sensitivity analysis of two-spectrum separation of surface and bulk components of minority carrier lifetime
    • J. Brody and A. Rohatgi, "Sensitivity analysis of two-spectrum separation of surface and bulk components of minority carrier lifetime," Solid-State Electronics 46, 2002, pp. 859-866.
    • (2002) Solid-State Electronics , vol.46 , pp. 859-866
    • Brody, J.1    Rohatgi, A.2
  • 10
    • 0012520913 scopus 로고    scopus 로고
    • Separation of bulk and surface recombination by steady state photoconductance measurements
    • M. Bail and R. Brendel, "Separation of bulk and surface recombination by steady state photoconductance measurements," Sixteenth European PV Conference, 2000.
    • Sixteenth European PV Conference, 2000
    • Bail, M.1    Brendel, R.2
  • 11
    • 0000682478 scopus 로고    scopus 로고
    • On the use of a bias-light correction for trapping effects in photo-conductance-based lifetime measurements of silicon
    • D. Macdonald, R. A. Sinton, and A. Cuevas, "On the use of a bias-light correction for trapping effects in photo-conductance-based lifetime measurements of silicon," J. Appl. Phys. 89, 2001, pp. 2772-2778.
    • (2001) J. Appl. Phys. , vol.89 , pp. 2772-2778
    • Macdonald, D.1    Sinton, R.A.2    Cuevas, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.