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Volumn 307-311, Issue 2 SUPPL., 2002, Pages 930-934
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Effect of undersized solute atoms on point defect behavior in V-A ( A = Fe, Cr and Si) binary alloys studied by using HVEM
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
BINARY ALLOYS;
ELECTRON MICROSCOPES;
MICROSTRUCTURE;
NUCLEATION;
VANADIUM ALLOYS;
ELECTRON FLUX;
POINT DEFECTS;
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EID: 0036953019
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3115(02)01162-5 Document Type: Article |
Times cited : (9)
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References (12)
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