Electronic transport across porous/crystalline silicon heterojunctions

Materials Research Society Symposium - Proceedings

Volumn 716, Issue , 2002, Pages 489-494

  Islam, Md N ^a   Ram, Sanjay K ^a   Kumar, Satyendra ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TRANSPORT PROPERTIES; ELECTRON TUNNELING; POROUS SILICON; THERMAL EFFECTS;

CRYSTALLINE SILICON; CURRENT TRANSPORT MECHANISMS; RECTIFYING BEHAVIOR;

HETEROJUNCTIONS;

EID: 0036951074     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-716-b11.7     Document Type: Conference Paper

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