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Volumn 18, Issue 2, 2002, Pages 133-139

Plasma species analysis for in situ assessment of surface treatments

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; GLOW DISCHARGES; ION IMPLANTATION; LIGHT EMISSION; MICROHARDNESS; NITRIDING; OPTICAL MICROSCOPY; PLASMA APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

EID: 0036950845     PISSN: 02670844     EISSN: None     Source Type: Journal    
DOI: 10.1179/026708402225002802     Document Type: Article
Times cited : (21)

References (14)
  • 1
    • 0000707133 scopus 로고
    • Plasma nitriding
    • Materials Park, OH, ASM International
    • J. M. O'BRIEN: 'Plasma nitriding', ASM Handbook, Vol. 4, 'Heat treating', 420-424; 1994, Materials Park, OH, ASM International.
    • (1994) ASM Handbook, Vol. 4, Heat Treating , pp. 420-424
    • O'Brien, J.M.1
  • 2
    • 0012486108 scopus 로고    scopus 로고
    • United States Patent, Number 5,989,363, November
    • J. GEORGES: United States Patent, Number 5,989,363, November 1999.
    • (1999)
    • Georges, J.1
  • 5
    • 0003799193 scopus 로고
    • Massachusetts Institute of Technology wavelength tables
    • New York, NY. John Wiley and Sons
    • HARRISON: 'Massachusetts Institute of Technology wavelength tables'; 1939, New York, NY, John Wiley and Sons.
    • (1939)
    • Harrison1
  • 7
    • 85036711034 scopus 로고    scopus 로고
    • Specline
    • OES Evaluation Software, 2000 Plasus GmbH
    • PLASUS: 'Specline' OES Evaluation Software, 2000 Plasus GmbH.
    • Plasus1
  • 8
    • 0015613660 scopus 로고
    • M. HUDIS: J. Appl. Phys., 1973, 44, (4), 1489-1496.
    • (1973) J. Appl. Phys. , vol.44 , Issue.4 , pp. 1489-1496
    • Hudis, M.1
  • 11


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.