Capacitance-frequency analysis of CdTe photovoltaics

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 752-755

  Shvydka, Diana ^a,b   Jayamaha, U ^a   Karpov, V G ^b   Compaan, A D ^b  

^a FIRST SOLAR   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM SULFIDE; CAPACITANCE; CRYSTAL DEFECTS; DEGRADATION; ELECTRON TRANSITIONS; ELECTRON TRAPS; ELECTRONIC DENSITY OF STATES; MATHEMATICAL MODELS; SEMICONDUCTING CADMIUM TELLURIDE; THERMAL EFFECTS;

CAPACITANCE-FREQUENCY ANALYSIS; DEFECT CAPACITANCE; DEVICE DEGRADATION; MULTIPHOTON CHARACTER;

PHOTOVOLTAIC CELLS;

EID: 0036948683     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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