Spectral characteristics of small- and large-volume CdTe detectors: Comparison among hemispheric, planar, and pixellated structure

IEEE Transactions on Nuclear Science

Volumn 49 II, Issue 6, 2002, Pages 3306-3313

  Sowinska, M ^a   Hennard, G ^a   Feder, D ^a   Hage Ali, M ^b   Koebel, J M ^b   Zumbiehl, A ^b   Ayoub, M ^b   Siffert, P ^b  

^a EURORAD   (France)

^b Faculté de Médecine   (France)

Author keywords

CdTe and CdZnTe semiconductor; Planar and hemispheric detectors; Spectroscopic properties

Indexed keywords

ELECTRIC POTENTIAL; GAMMA RAYS; LEAKAGE CURRENTS; SEMICONDUCTING CADMIUM TELLURIDE; SURFACE PROPERTIES;

X-RAY DETECTORS;

RADIATION DETECTORS;

EID: 0036948180     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.806239     Document Type: Article

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