Backside SEU laser testing for commercial off-the-shelf SRAMs

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 2977-2983

  Darracq, F ^a   Lapuyade, H ^a   Buard, N ^b   Mounsi, F ^b   Foucher, B ^b   Fouillat, P ^a   Calvet, M C ^b   Dufayel, R ^b  

^a UNIVERSITÉ BORDEAUX 1   (France)

^b AIRBUS GROUP INNOVATIONS   (Germany)

Author keywords

Backside laser testing; Single event upset; SRAM

Indexed keywords

CMOS INTEGRATED CIRCUITS; HEAVY IONS; LASER APPLICATIONS; PARTICLE ACCELERATORS; SUBSTRATES;

LASER TESTING;

STATIC RANDOM ACCESS STORAGE;

EID: 0036947578     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805393     Document Type: Conference Paper

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