New concepts to measure, calculate and analyze textures in materials

Materials Science Forum

Volumn 408-412, Issue I, 2002, Pages 101-106

  Weiland, Hasso ^a   Fridy, Joseph M ^a   Llewellyn, Ed ^a  

^a ALCOA INC   (United States)

Author keywords

Pole Figure Inversion; Texture Analysis; Texture Measurement; Volume Fraction; X Ray Diffraction

Indexed keywords

ANISOTROPY; CAMERAS; CHARGE COUPLED DEVICES; CRYSTALLOGRAPHY; FINITE ELEMENT METHOD; TEXTURES; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC TEXTURE ANALYSIS;

MATERIALS SCIENCE;

EID: 0036946984     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.408-412.101     Document Type: Conference Paper

References (8)

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3. H.J. Bunge, J. Tobisch, J. Appl. Cryst. 5, 1972. 27
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5. F. Barlat, Mat. Sci. and Eng., 91 (1987), pp. 55-72
6. R. A. Schwarzer and H. Weiland, in: Experimental Techniques of Texture Analysis, ed. H.J.Bunge DGM Verlag, Oberursel 1985, 287-300
7. H. Weiland and S. Panchanadeeswaran, Textures and Microstructures Vol. 20, (No.1-4) 1993, pp.67-86
8. R. Becker and S. Panchanadeeswaran, Texture and Microstructures, Vol. 10 (1989), pp. 167-194