Analysis of XRD stress measurement data of naturally grown oxide films Al2O3 and Cr2O3 based on existing Reuss, Voigt, and Hill models

Surface Engineering

Volumn 18, Issue 2, 2002, Pages 105-112

  Sarioglu, C ^a  

^a MARMARA UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHROMIUM COMPOUNDS; HIGH TEMPERATURE PROPERTIES; MATHEMATICAL MODELS; RESIDUAL STRESSES; STRAIN; THERMAL STRESS; X RAY DIFFRACTION ANALYSIS;

CHROMIA; HILL MODELS; REUSS MODELS; STRESS MEASUREMENT; VOIGT MODELS;

FILM GROWTH;

EID: 0036945927     PISSN: 02670844     EISSN: None     Source Type: Journal    
DOI: 10.1179/026708402225002767     Document Type: Article

References (13)

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