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Volumn 24, Issue 4, 2002, Pages 557-564
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DC and TEM test sounding for the Bayishuiku-Shanggan fault in Fuzhou City, Fujian Provice, China
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Author keywords
Bayishuiku Shanggan fault; Multi electrode direct current method; Transient electromagnetic method
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Indexed keywords
ACTIVE FAULT;
DETECTION METHOD;
ELECTROMAGNETIC METHOD;
URBAN AREA;
CHINA;
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EID: 0036943561
PISSN: 02534967
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (5)
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