Drain-accelerated degradation of tunnel oxides in Flash memories

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2002, Pages 167-170

  Chimenton, A ^a   Spinelli, A S ^b   Ielmini, D ^c   Lacaita, A L ^c   Visconti, A ^d   Olivo, P ^a  

^a UNIVERSITY OF FERRARA   (Italy)

^b UNIVERSITY OF INSUBRIA   (Italy)

^c POLITECNICO DI MILANO   (Italy)

^d STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTRIC CHARGE; ELECTRIC POTENTIAL; FLASH MEMORY; OXIDES;

DRAIN-ACCELERATED DEGRADATION;

ELECTRON TUNNELING;

EID: 0036932374     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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