Characterization of controlled pore glasses by small angle x-ray scattering and evaluation of the scattering data by he indirect fourier transformation method

Studies in Surface Science and Catalysis

Volumn 144, Issue , 2002, Pages 769-774

  Christoforides, A ^a   Kanellopoulos, N ^b   Mitropoulos, A ^a   Stefanopoulos, K L ^b   Tarchanides, K ^a  

^a Cavala Institute of Technology   (Greece)

^b INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

GLASS;

CONFERENCE PAPER; DISPERSION; FOURIER TRANSFORMATION; FRACTAL ANALYSIS; PARTICLE SIZE; POROSITY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TEMPERATURE DEPENDENCE; X RAY CRYSTALLOGRAPHY;

EID: 0036927303     PISSN: 01672991     EISSN: None     Source Type: Book Series    
DOI: 10.1016/s0167-2991(02)80208-7     Document Type: Conference Paper

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