Characterization of high-Tc ramp-type Josephson junctions constructed with a Nd2CuO44 barrier

Superconductor Science and Technology

Volumn 15, Issue 12, 2002, Pages 1685-1688

  Gao, Ju ^a   So, S M ^a   Wang, Z H ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; FABRICATION; GROWTH (MATERIALS); HIGH TEMPERATURE SUPERCONDUCTORS; NEODYMIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

MULTILAYER JUNCTIONS;

JOSEPHSON JUNCTION DEVICES;

EID: 0036925130     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/15/12/310     Document Type: Article

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