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Volumn 234, Issue 3, 2002, Pages 769-772
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Modelling of polarization charge-induced asymmetry of I-V characteristics of AlN/GaN-based resonant tunnelling structures
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0036920882
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-3951(200212)234:3<769::AID-PSSB769>3.0.CO;2-H Document Type: Conference Paper |
Times cited : (20)
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References (3)
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