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Volumn 234, Issue 3, 2002, Pages 769-772

Modelling of polarization charge-induced asymmetry of I-V characteristics of AlN/GaN-based resonant tunnelling structures

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EID: 0036920882     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200212)234:3<769::AID-PSSB769>3.0.CO;2-H     Document Type: Conference Paper
Times cited : (20)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.