Spectro-ellipsometry on cadmium stearate Langmuir-Blodgett films

Materials Science and Engineering C

Volumn 22, Issue 2, 2002, Pages 359-366

  Gonella, G ^a,b   Cavalleri, O ^a   Emilianov, I ^a   Mattera, L ^a,b   Canepa, M ^a,b   Rolandi, R ^a  

^a UNIVERSITY OF GENOA   (Italy)

^b Laboratory of Innovative and Artificial Materials Genoa   (Italy)

Author keywords

Cadmium stearate; Langmuir Blodgett; Spectro ellipsometry

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; ELLIPSOMETRY; MONOLAYERS; SILICON WAFERS; X RAY ANALYSIS;

X-RAY REFLECTIVITY;

LANGMUIR BLODGETT FILMS;

FILM;

EID: 0036920807     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(02)00208-4     Document Type: Article

References (14)