Lifetime of magnetic tunnel junctions under voltage stress

Digests of the Intermag Conference

Volumn , Issue , 2002, Pages

  Gibbons, Matthew ^a   Sin, Kyusik ^a   Funada, Shin ^a   Shi, Xizeng ^a  

^a WESTERN DIGITAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; MAGNETRON SPUTTERING; OXIDATION;

MAGNETIC TUNNEL JUNCTION (MTJ);

TUNNEL JUNCTIONS;

EID: 0036916890     PISSN: 00746843     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)