Optimal selection of the most reliable product with degradation data

Engineering Optimization

Volumn 34, Issue 6, 2002, Pages 579-590

  Yu, Hong Fwu ^a  

^a NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

Degradation data; Inspection frequency; Manufacturing; Reliability; Termination time

Indexed keywords

COST EFFECTIVENESS; DEGRADATION; INSPECTION; INTEGER PROGRAMMING; MANUFACTURE; NONLINEAR PROGRAMMING; PROBABILITY; PRODUCT DESIGN; RELIABILITY; RESEARCH AND DEVELOPMENT MANAGEMENT;

DEGRADATION DATA;

PRODUCT DEVELOPMENT;

EID: 0036912225     PISSN: 0305215X     EISSN: None     Source Type: Journal    
DOI: 10.1080/03052150215723     Document Type: Article

References (24)

1. Kim, J.S. (1988). A subset selection procedure for exponential populations under random censoring. Communications in Statistics - Theory, Methods, 17, 183-206.
2. Kingston, J.V and Patel, J.K. (1980). Selecting the best one of several Weibull populations. Communications in Statistics - Theory, Method, 9, 383-398.
3. Kingston, J.V. and Patel, J.K. (1980). A restriction subset selection procedure for Weibull populations. Communications in Statistics - Theory, Method, 9, 1371-1383.
4. Kingston, J.V. and Patel, J.K. (1982). Classifying Weibull populations with respect to a control. Communications in Statistics - Theory, Method, 11, 899-909.
5. Tseng, S.T. (1988). Selecting more reliable Weibull populations than a control. Communications in Statistics Theory, Method, 17, 169-180.
6. Tseng, S.T. and Chang, D.S. (1989). Selecting the most reliable design under type-II censoring. Reliability Engineering and System Safety, 25, 147-156.
7. Tseng, S.T. and Wu, H.J. (1990). Selecting, under type-II censoring, Weibull populations that are most reliable. IEEE Transactions on Reliability, 39, 193-198.
8. Gupta, S.S. and Panchapakesan, S. (1988). Selection and ranking procedures in reliability models. In: Krishnaiah, P.R. and Rao, C.R. (Eds.), Handbooks of Statistics 7. North-Holland, Amsterdam, pp. 131-156.
9. Chang, D.S., Huang, D.Y. and Tseng, S.T. (1992). Selecting the most reliable design under type-II censored accelerated test. IEEE Transactions on Reliability, 41, 588-592.
10. Tseng, S.T., Huang, D.Y. and Wu, T.Y. (1994). A sampling plan for selecting the most reliable product under the Arrhenius accelerated life test model. Statistica Sinica, 4, 233-247.
11. Tseng, S.T. (1994). Planning accelerated life tests for selecting the most reliable product under the Weibull-inverse power model. Journal of Statistical Planning and Inference, 41, 215-230.
12. Nelson, W. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analysis. John Wiley & Sons, New York.
13. Meeker, W.Q. and Escobar, L.A. (1998). Statistical Methods for Reliability Data. John Wiley & Sons, New York.
14. Lu, C.J. and Meeker, W.Q. (1993). Using degradation measures to estimate a time-to-failure distribution. Technometrics, 35, 161-174.
15. Tseng, S.T., Hamada, M. and Chiao, C.H. (1995). Using degradation data to improve fluorescent lamp reliability. Journal of Quality Technology, 27, 363-369.
16. Tseng, S.T and Yu, H.F. (1997). A termination rule for degradation experiments. IEEE Transactions on Reliability, 46, 130-133.
17. Yu, H.F. and Tseng, S.T. (1999). Designing a degradation experiment. Naval Researeh Logistics, 46, 689-706.
18. xAsLED's. Applied Physics Letters, 31, 627-629.
19. Yamakoshi, S., Abe, M., Wada, O., Komiya, S. and Sakurai, T. (1981). Reliability of high radiance InGaAsP/InP LED's operating in the 1.2-1.3 μm wavelength. IEEE Journal of Quantum Electronics, 167-172.
20. Ralston, J.M. and Mann, J.W. (1979). Temperature and current dependence of degradation in red-emitting GaP LED's. Journal of Applied Physics, 50, 3630-3637.
21. Meeker, W.Q. and Escobar, L.A. (1993). A review of research and current issues in accelerated testing. International Statistical Review, 61, 147-168.
22. Boulanger, M. and Escobar, L.A. (1994). Experimental design for a class of accelerated degradation tests. Technometrics, 36, 260-272.
23. Mood, A.M., Graybill, F.A. and Boes, D.C. (1976). Introduction to the Theory of Statistics, 3rd ed. McGrawHill, New York.
24. Herstein, I.N. (1975). Topics in Algebra. Xerox Corporation, New York.