Improved HgCdTe-technology for high performance infrared detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4721, Issue , 2002, Pages 242-251

  Ziegler, J ^a   Bruder, M ^a   Cabanski, W ^a   Figgemeier, H ^a   Finck, M ^a   Menger, P ^a   Simon, Th ^a   Wollrab, R ^a  

^a AIM INFRAROT MODULE GMBH   (Germany)

Author keywords

HgCdTe focal plane array; HgCdTe technology; Infrared detector; MTF improvement; Temperature cycling reliability; Yield

Indexed keywords

CROSSTALK; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); FLIP CHIP DEVICES; OPTICAL TRANSFER FUNCTION; RELIABILITY; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DIODES; SUBSTRATES; THERMAL CYCLING;

BRIDGMAN GROWTH PROCESS; CADMIUM ZINC TELLURIDE; FOCAL PLANE ARRAY; MERCURY CADMIUM TELLURIDE; TEMPERATURE CYCLING RELIABILITY;

INFRARED DETECTORS;

EID: 0036907347     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.478853     Document Type: Conference Paper

References (5)

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