Eddy-current evaluation of three-dimensional flaws in flat conductive materials using a Bayesian approach

Inverse Problems

Volumn 18, Issue 6, 2002, Pages 1873-1889

  Prémel, Denis ^a,b   Baussard, Alexandre ^a  

^a Centre National de la Recherche Scientifique   (France)

^b CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CONDUCTIVE MATERIALS; DATA REDUCTION; ELECTRIC CONDUCTIVITY; INTEGRAL EQUATIONS; INVERSE PROBLEMS; METHOD OF MOMENTS;

BAYESIAN APPROACH;

EDDY CURRENT TESTING;

EID: 0036904597     PISSN: 02665611     EISSN: None     Source Type: Journal    
DOI: 10.1088/0266-5611/18/6/326     Document Type: Article

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