A novel method to estimate the thickness of the depletion layer of an X-ray CCD

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 495, Issue 3, 2002, Pages 232-239

  Awaki, H ^a   Tachibana, K ^a,d   Tamai, Y ^a,e   Yamamoto, K ^a,f   Kitamoto, S ^b   Tsujimoto, M ^c  

^a EHIME UNIVERSITY   (Japan)

^b RIKKYO UNIVERSITY   (Japan)

^c KYOTO UNIVERSITY   (Japan)

^d Oriental Kiden Co Ltd   (Japan)

^e NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^f NIDEC CORPORATION   (Japan)

Author keywords

CCD; Depletion layer; Geant4

Indexed keywords

COMPUTER SIMULATION; ELEMENTARY PARTICLES; ENERGY DISSIPATION; ERROR ANALYSIS; X RAYS;

DEPLETION LAYER;

CHARGE COUPLED DEVICES;

EID: 0036893093     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)01612-1     Document Type: Article

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