An analysis of safety-critical digital systems for risk-informed design

Reliability Engineering and System Safety

Volumn 78, Issue 3, 2002, Pages 307-314

  Kang, Hyun Gook ^a   Sung, Taeyong ^a  

^a Korea Atomic Energy Research Institute   (South Korea)

Author keywords

Common cause failure; Digital systems; Fault coverage; Probabilistic safety assessment; Sensitivity study; Software failure

Indexed keywords

PROBABILITY; RISK ASSESSMENT; SECURITY OF DATA; SENSITIVITY ANALYSIS;

DIGITAL SYSTEMS;

SYSTEMS SCIENCE;

EID: 0036891201     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(02)00176-X     Document Type: Article

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