Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive interconnects

Microelectronics Reliability

Volumn 42, Issue 12, 2002, Pages 1945-1951

  Chiu, Y W ^a   Chan, Y C ^a   Lui, S M ^b  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^b Varitronix Limited   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE JOINTS; ANISOTROPY; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; ELECTRIC RESISTANCE; ELECTRONIC EQUIPMENT TESTING; LIQUID CRYSTAL DISPLAYS; OPTICAL INTERCONNECTS; SHORT CIRCUIT CURRENTS;

CHIP-ON-GLASS (COG);

CONDUCTIVE FILMS;

EID: 0036890938     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00097-5     Document Type: Article

References (8)

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